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2023

Abdelkrim, Tayssir; Hassen, Walid Ben; Abdelkrim, Nouceyba; Tellili, Adel

Diagnosis and FTC : descriptor approach Proceedings Article

Dans: 2023 IEEE International Workshop on Mechatronic Systems Supervision (IW_MSS), p. 1-9, 2023.

Résumé | Liens | BibTeX | Étiquettes: Fault diagnosis;Linear systems;Mechatronics;Fault tolerant control;Observers;Sensor phenomena and characterization;Sensor systems;Observer;Faults estimation;Sensor faults;Descriptor approach;LMI;Time-delay system

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